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Hygro-thermo-mechanical analysis and failure prediction in electronic packages by using peridynamics

机译:电子封装中的湿热力学分析和失效预测

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摘要

This study presents an integrated approach for the simulation of hygro-thermo-vapor-deformation analysis of electronic packages by using peridynamics. This theory is suitable for such analysis because of its mathematical structure. Its governing equation is an integro-differential equation and it is valid regardless of the existence of material and geometric discontinuities in the structure. It permits the specification of distinct properties of interfaces between dissimilar materials in the direct modeling of thermal and moisture diffusion, and deformation. Therefore, it enables progressive damage analysis in materials or layered material systems such as the electronic packages. It describes the validation procedure by considering a particular package for each thermomechanical, hygromechanical deformation as well as vapor pressure predictions. Also, it presents results concerning failure sites and mechanisms due to hygro-thermo-vapor-deformation.
机译:这项研究提出了一种综合方法,通过使用绕动力学来模拟电子封装的湿热-热-蒸气变形分析。由于该理论的数学结构,因此适合于此类分析。它的控制方程是一个积分微分方程,无论结构中是否存在材料和几何不连续性,该方程都是有效的。它允许在热和湿气扩散以及变形的直接建模中指定不同材料之间的界面的不同属性。因此,它可以对材料或分层材料系统(如电子封装)进行渐进式损伤分析。它通过考虑针对每个热机械,湿机械变形以及蒸气压预测的特定包装来描述验证过程。此外,它还提供了有关由于湿热蒸汽变形引起的失效部位和机理的结果。

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